The unique SCANRAY 1230 HS (High-Speed) digital radiography system offers several important advantages compared to ‘‘classic’’ DR solutions. In many applications, these features significantly boost the inspection workflow and improve image quality. At the same time, high-speed detectors require specific handling and attention during operation. The SCANRAY 1230 HS can be used as a universal solution with Gamma sources for the inspection of objects of any geometry, provided the procedure described below is followed. The system can also be used with X-ray generators, but only when there is no direct radiation exposure of the detector surface (i.e., the inspected object must fully cover the flat-panel detector).
The unique SCANRAY 1230 HS (High-Speed) digital radiography system offers several important advantages compared to ‘‘classic’’ DR solutions. In many applications, these features significantly boost the inspection workflow and improve image quality. At the same time, high-speed detectors require specific handling and attention during operation. The SCANRAY 1230 HS can be used as a universal solution with Gamma sources for the inspection of objects of any geometry, provided the procedure described below is followed. The system can also be used with X-ray generators, but only when there is no direct radiation exposure of the detector surface (i.e., the inspected object must fully cover the flat-panel detector).
The unique SCANRAY 1230 HS (High-Speed) digital radiography system offers several important advantages compared to ‘‘classic’’ DR solutions. In many applications, these features significantly boost the inspection workflow and improve image quality. At the same time, high-speed detectors require specific handling and attention during operation. The SCANRAY 1230 HS can be used as a universal solution with Gamma sources for the inspection of objects of any geometry, provided the procedure described below is followed. The system can also be used with X-ray generators, but only when there is no direct radiation exposure of the detector surface (i.e., the inspected object must fully cover the flat-panel detector).
